Jerin Joe

Orcid: 0000-0002-6738-2491

According to our database¹, Jerin Joe authored at least 3 papers between 2022 and 2024.

Collaborative distances:

Timeline

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2024

Generation of Two-Cycle Tests for Structurally Similar Circuits.

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., February, 2024

2022

Fast Test Generation for Structurally Similar Circuits.

[DOI]

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Test Generation for an Iterative Design Flow with RTL Changes.

[DOI]

Proceedings of the IEEE International Test Conference, 2022