Jia Li

Affiliations:
  • Chinese Academy of Sciences, Institute of Microelectronics, Smart Sensing Research and Development Center, Beijing, China
  • Tsinghua University, School of Software, Beijing, China (2009 - 2011)
  • Chinese Academy and Sciences, Institute of Computing Technology, Beijing, China (PhD 2009)


According to our database1, Jia Li authored at least 19 papers between 2006 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

Online presence:

On csauthors.net:

Bibliography

2022
Machine Learning and Swarm Optimization Algorithm in Temperature Compensation of Pressure Sensors.
Sensors, 2022

Inertial Indoor Pedestrian Navigation Based on Cascade Filtering Integrated INS/Map Information.
Sensors, 2022

2021
A Class-Imbalanced Deep Learning Fall Detection Algorithm Using Wearable Sensors.
Sensors, 2021

2020
A Built-In Self-Test Method For MEMS Piezoresistive Sensor.
Proceedings of the IEEE European Test Symposium, 2020

2018
A Fault-Tolerant BIST Design of MEMS Infrared Thermopile Sensor.
Proceedings of the 2018 IEEE SENSORS, New Delhi, India, October 28-31, 2018, 2018

2014
Built-in self-calibration of CMOS-compatible thermopile sensor with on-chip electrical stimulus.
Proceedings of the 19th IEEE European Test Symposium, 2014

2011
Capture-power-aware test data compression using selective encoding.
Integr., 2011

Scan chain design for shift power reduction in scan-based testing.
Sci. China Inf. Sci., 2011

Prediction of compression bound and optimization of compression architecture for linear decompression-based schemes.
Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment.
Proceedings of the 20th IEEE Asian Test Symposium, 2011

Compression-aware capture power reduction for at-speed testing.
Proceedings of the 16th Asia South Pacific Design Automation Conference, 2011

2010
X-Filling for Simultaneous Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing.
IEEE Trans. Very Large Scale Integr. Syst., 2010

DfT optimization for pre-bond testing of 3D-SICs containing TSVs.
Proceedings of the 28th International Conference on Computer Design, 2010

2008
On capture power-aware test data compression for scan-based testing.
Proceedings of the 2008 International Conference on Computer-Aided Design, 2008

Channel Width Utilization Improvement in Testing NoC-Based Systems for Test Time Reduction.
Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008

iFill: An Impact-Oriented X-Filling Method for Shift- and Capture-Power Reduction in At-Speed Scan-Based Testing.
Proceedings of the Design, Automation and Test in Europe, 2008

On reducing both shift and capture power for scan-based testing.
Proceedings of the 13th Asia South Pacific Design Automation Conference, 2008

2006
A Scan Chain Adjustment Technology for Test Power Reduction.
Proceedings of the 15th Asian Test Symposium, 2006

Test data compression based on clustered random access scan.
Proceedings of the 15th Asian Test Symposium, 2006


  Loading...