Jiafei Yao

Orcid: 0000-0002-1469-0677

According to our database1, Jiafei Yao authored at least 12 papers between 2023 and 2026.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2026
A Generalized Design Methodology for Multi-Input Collaborative-Flip Synchronized Switch Harvesting on Capacitors: From Theory to Optimization Strategy.
IEEE Trans. Very Large Scale Integr. Syst., June, 2026

High breakdown GaN-on-Si HEMT with a self-modulated substrate voltage.
Microelectron. J., 2026

High performance 4H-SiC double-trench super-junction MOSFET with embedded SBD.
Microelectron. J., 2026

Output and transfer characteristics prediction of GaN HEMT via neural-network-based compact model parameters extraction.
Microelectron. J., 2026

2025
Efficient Automatic Design of IGBT Structural Parameters Using Differential Evolution and Machine Learning Model.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., March, 2025

Self-adaptive body bias tuning technique for enhancing Baliga's figure-of-merit (BFOM) in thin bulk silicon LDMOS.
Microelectron. J., 2025

A novel double-trench SiC SBD-embedded MOSFET with improved figure-of-merit and short-circuit ruggedness.
Microelectron. J., 2025

A cross-scale investigation on transient electrothermal performance for power MOSFETs at device-package level.
Microelectron. J., 2025

2024
Performance enhancement of 4H-SiC superjunction trench MOSFET with extended high-K dielectric.
Microelectron. J., 2024

General neural network-based static performance prediction model construction techniques for gate-all-around and planar field effect transistor.
Microelectron. J., 2024

Step thickness drift region automatic design of SOI LDMOS using physics-inspired constrained simulated annealing algorithm.
Microelectron. J., 2024

2023
Tradeoff Between the Breakdown Voltage and Specific On-Resistance of SOI RESURF LDMOS.
Proceedings of the 15th IEEE International Conference on ASIC, 2023


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