John E. McDermid

According to our database, John E. McDermid authored at least 4 papers between 1993 and 1998.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

1998

Limited access testing: IEEE 1149.4-instrumentation and methods.

John E. McDermid

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Will 0.1um Digital Circuits Require Mixed-Signal Testing.

Melvin A. Breuer, Bozena Kaminska, John E. McDermid, V. Rayapathi, Donald L. Wheater

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Design, Fabrications and Use of Mixed-Signal IC Testability Structures.

Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1993

Structure and Metrology for an Analog Testability Bus.

Kenneth P. Parker, John E. McDermid, Stig Oresjo

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993