Jose Angel Ortiz Gonzalez
Orcid: 0000-0002-1461-3735Affiliations:
- University of Warwick, Coventry, UK
According to our database1,
Jose Angel Ortiz Gonzalez
authored at least 10 papers
between 2016 and 2021.
Collaborative distances:
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Bibliography
2021
Impact of Temperature and Switching Rate on Properties of Crosstalk on Symmetrical & Asymmetrical Double-trench SiC Power MOSFET.
Proceedings of the IECON 2021, 2021
2020
Performance and Reliability Review of 650 V and 900 V Silicon and SiC Devices: MOSFETs, Cascode JFETs and IGBTs.
IEEE Trans. Ind. Electron., 2020
Non-Intrusive Methodologies for Characterization of Bias Temperature Instability in SiC Power MOSFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2018
Microelectron. Reliab., 2018
2017
IEEE Trans. Ind. Electron., 2017
Evaluation of the impact of the physical dimensions and material of the semiconductor chip on the reliability of Sn3.5Ag solder interconnect in power electronic module: A finite element analysis perspective.
Microelectron. Reliab., 2017
Impact of the gate driver voltage on temperature sensitive electrical parameters for condition monitoring of SiC power MOSFETs.
Microelectron. Reliab., 2017
2016
Temperature and Switching Rate Dependence of Crosstalk in Si-IGBT and SiC Power Modules.
IEEE Trans. Ind. Electron., 2016
IEEE Trans. Ind. Electron., 2016
Development and characterisation of pressed packaging solutions for high-temperature high-reliability SiC power modules.
Microelectron. Reliab., 2016