Joseph Rayhawk

According to our database, Joseph Rayhawk authored at least 5 papers between 2003 and 2005.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2005

Chasing subtle embedded RAM defects for nanometer technologies.

Theo J. Powell, Amrendra Kumar, Joseph Rayhawk, Nilanjan Mukherjee

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Memory BIST Using ESP.

Xiaogang Du, Sudhakar M. Reddy, Don E. Ross, Wu-Tung Cheng, Joseph Rayhawk

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

At-Speed Built-in Self-Repair Analyzer for Embedded Word-Oriented Memories.

Xiaogang Du, Sudhakar M. Reddy, Wu-Tung Cheng, Joseph Rayhawk, Nilanjan Mukherjee

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

2003

BIST for Deep Submicron ASIC Memories with High Performance Application.

Theo J. Powell, Wu-Tung Cheng, Joseph Rayhawk, Omer Samman, Paul Policke, Sherry Lai

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Testing Delay Faults in Embedded CAMs.

Xiaogang Du, Sudhakar M. Reddy, Joseph Rayhawk, Wu-Tung Cheng

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003