Jungwoo Joh
According to our database1,
Jungwoo Joh
authored at least 11 papers
between 2009 and 2024.
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Bibliography
2024
Mission Profile Approach for the Calculation of GaN FET Reliability in Power Supply Applications (Invited).
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2017
Proceedings of the Information Security Applications - 18th International Conference, 2017
2012
Impact of gate placement on RF power degradation in GaN high electron mobility transistors.
Microelectron. Reliab., 2012
2011
Role of stress voltage on structural degradation of GaN high-electron-mobility transistors.
Microelectron. Reliab., 2011
2010
A model for the critical voltage for electrical degradation of GaN high electron mobility transistors.
Microelectron. Reliab., 2010
High voltage degradation of GaN High Electron Mobility Transistors on silicon substrate.
Microelectron. Reliab., 2010
2009
PhD thesis, 2009