Karansingh Thakor

According to our database1, Karansingh Thakor authored at least 3 papers between 2021 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2022
Modeling Time and Bias Dependence of Classical HCD Mechanism (Peak ISUB Stress) in n-MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
A Theoretical Framework for Trap Generation and Passivation in NAND Flash Tunnel Oxide During Distributed Cycling and Retention Bake.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021


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