Karansingh Thakor
According to our database1,
Karansingh Thakor
authored at least 3 papers
between 2021 and 2022.
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Bibliography
2022
Modeling Time and Bias Dependence of Classical HCD Mechanism (Peak ISUB Stress) in n-MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
A Theoretical Framework for Trap Generation and Passivation in NAND Flash Tunnel Oxide During Distributed Cycling and Retention Bake.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021