Uma Sharma

According to our database, Uma Sharma authored at least 10 papers between 2017 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Efficient Design of FGMOS-Based Low-Power Low-Voltage XOR Gate.

Uma Sharma, Mansi Jhamb

Circuits Syst. Signal Process., May, 2023

Exploring Low-Power Implementation Techniques for 2:1 MUX Using Conventional and CNTFET Technology: a Performance Comparison.

Priya Singh, Uma Sharma

Proceedings of the 14th International Conference on Computing Communication and Networking Technologies, 2023

Recent Trends To Detect Melanoma Using Dermoscopic Images: A Survey.

Uma Sharma, Preeti Aggarwal, Ajay Mittal

Proceedings of the 14th International Conference on Computing Communication and Networking Technologies, 2023

2022

A Novel Design of Voltage and Temperature Resilient 9-T Domino Logic XOR /XNOR Cell.

Uma Sharma, Mansi Jhamb

Circuits Syst. Signal Process., 2022

2021

Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs.

Satyam Kumar, Tarun Samadder, Karansingh Thakor, Uma Sharma, Souvik Mahapatra

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity.

Victor M. van Santen, Simon Thomann, Chaitanya Pasupuleti, Paul R. Genssler, Narendra Gangwar, Uma Sharma, Jörg Henkel, Souvik Mahapatra, Hussam Amrouch

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs.

Nilotpal Choudhury, Uma Sharma, Huimei Zhou, Richard G. Southwick, Miaomiao Wang, Souvik Mahapatra

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Hot Carrier Degradation in Cryo-CMOS.

Wriddhi Chakraborty, Uma Sharma, Suman Datta, Souvik Mahapatra

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs.

Narendra Parihar, Uma Sharma, Richard G. Southwick, Miaomiao Wang, James H. Stathis, Souvik Mahapatra

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2017

Discrete Transform Based Image Fusion: A Review.

Umesh Kumar, Neha Gopaliya, Uma Sharma, Sandeep Gupta

Int. J. Multim. Data Eng. Manag., 2017