Kiran B. Doreswamy

According to our database, Kiran B. Doreswamy authored at least 6 papers between 1998 and 2003.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2003

Efficient Implication - Based Untestable Bridge Fault Identifier.

Manan Syal, Michael S. Hsiao, Kiran B. Doreswamy, Sreejit Chakravarty

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

2000

A Practical Vector Restoration Technique for Large Sequential Circuits.

Surendra Bommu, Kiran B. Doreswamy, Srimat T. Chakradhar

J. Electron. Test., 2000

Resource-Constrained Compaction of Sequential Circuit Test Sets.

Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy

Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000

1998

Static test sequence compaction based on segment reordering and accelerated vector restoration.

Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Static compaction using overlapped restoration and segment pruning.

Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy

Proceedings of the 1998 IEEE/ACM International Conference on Computer-Aided Design, 1998

Vector Restoration Using Accelerated Validation and Refinement.

Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998