Manan Syal

According to our database, Manan Syal authored at least 11 papers between 2003 and 2006.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2006

New techniques for untestable fault identification in sequential circuits.

Manan Syal, Michael S. Hsiao

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

A Study of Implication Based Pseudo Functional Testing.

Manan Syal, Kameshwar Chandrasekar, Vishnu C. Vimjam, Michael S. Hsiao, Yi-Shing Chang, Sreejit Chakravarty

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Static Learning for Problems in VLSI Test and Verification.

Manan Syal

PhD thesis, 2005

Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults.

Manan Syal, Rajat Arora, Michael S. Hsiao

Proceedings of the 23rd International Conference on Computer Design (ICCD 2005), 2005

VERISEC: verifying equivalence of sequential circuits using SAT.

Manan Syal, Michael S. Hsiao

Proceedings of the Tenth IEEE International High-Level Design Validation and Test Workshop 2005, Napa Valley, CA, USA, November 30, 2005

Untestable fault identification through enhanced necessary value assignments.

Vishnu C. Vimjam, Manan Syal, Michael S. Hsiao

Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, 2005

Untestable Multi-Cycle Path Delay Faults in Industrial Designs.

Manan Syal, Michael S. Hsiao, Suriyaprakash Natarajan, Sreejit Chakravarty

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004

Untestable Fault Identification using Recurrence Relations and Impossible Value Assignments.

Manan Syal, Michael S. Hsiao

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks.

Manan Syal, Michael S. Hsiao, Sreejit Chakravarty

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Efficient Implication - Based Untestable Bridge Fault Identifier.

Manan Syal, Michael S. Hsiao, Kiran B. Doreswamy, Sreejit Chakravarty

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

A Novel, Low-Cost Algorithm for Sequentially Untestable Fault Identification.

Manan Syal, Michael S. Hsiao

Proceedings of the 2003 Design, 2003