Long-Yi Lin

According to our database, Long-Yi Lin authored at least 8 papers between 2012 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2022

Accurate and Fast On-Wafer Test Circuitry Integrated With a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT.

Long-Yi Lin, Hao-Chiao Hong

IEEE Trans. Circuits Syst. I Regul. Pap., 2022

2019

Design of a 0.20-0.25-V, Sub-nW, Rail-to-Rail, 10-bit SAR ADC for Self-Sustainable IoT Applications.

Hao-Chiao Hong, Long-Yi Lin, Yi Chiu

IEEE Trans. Circuits Syst. I Regul. Pap., 2019

Accurate and Fast On-Wafer Test Circuitry for Device Array Characterization in Wafer Acceptance Test.

Hao-Chiao Hong, Long-Yi Lin

IEEE Trans. Circuits Syst. I Regul. Pap., 2019

2017

An Enhanced Boundary Scan Architecture for Inter-Die Interconnect Leakage Measurement in 2.5D and 3D Packages.

Pok Man Preston Law, Cheng-Wen Wu, Long-Yi Lin, Hao-Chiao Hong

Proceedings of the 26th IEEE Asian Test Symposium, 2017

2016

A Study on the Transfer Function Based Analog Fault Model for Linear and Time-Invariant Continuous-Time Analog Circuits.

Hao-Chiao Hong, Long-Yi Lin

Proceedings of the 25th IEEE Asian Test Symposium, 2016

2014

A Cost-Effective Stimulus Generator for Battery Channel Characterization in Electric Vehicles.

Shao-Feng Hung, Long-Yi Lin, Hao-Chiao Hong

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Design of a Fault-Injectable Fleischer-Laker Switched-Capacitor Biquad for Verifying the Static Linear Behavior Fault Model.

Long-Yi Lin, Hao-Chiao Hong

Proceedings of the 22nd Asian Test Symposium, 2013

2012

Testing the Fleischer-Laker switched-capacitor biquad using the diagnosis-after-test procedure.

Shao-Feng Hung, Long-Yi Lin, Hao-Chiao Hong

Proceedings of the International SoC Design Conference, 2012