M. Kraatz

According to our database, M. Kraatz authored at least 1 paper in 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Analysis of electromigration-induced backflow stresses in Cu(Mn) interconnects using high statistical sampling.

M. Kraatz, Christoph Sander, André Clausner, M. Hauschildt, Yvonne Standke, Martin Gall, Ehrenfried Zschech

Proceedings of the IEEE International Reliability Physics Symposium, 2018