M. Röhner

According to our database1, M. Röhner authored at least 2 papers between 2006 and 2014.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

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Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2014
HCS degradation of 5 nm oxide high-voltage PLDMOS.
Microelectron. Reliab., 2014

2006
Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides.
Microelectron. Reliab., 2006


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