Stefano Aresu

According to our database1, Stefano Aresu authored at least 11 papers between 2002 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2023
28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers.
Proceedings of the IEEE International Memory Workshop, 2023

2014
HCS degradation of 5 nm oxide high-voltage PLDMOS.
Microelectron. Reliab., 2014

2012
New insights on the PBTI phenomena in SiON pMOSFETs.
Microelectron. Reliab., 2012

2008
Reduction of test effort. Looking for more acceleration for reliable components for automotive applications.
Microelectron. Reliab., 2008

New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure.
Microelectron. Reliab., 2008

NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique.
Microelectron. Reliab., 2008

2007
Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices.
Microelectron. Reliab., 2007

Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors.
Microelectron. Reliab., 2007

2004
Evidence for source side injection hot carrier effects on lateral DMOS transistors.
Microelectron. Reliab., 2004

2003
A new method for the analysis of high-resolution SILC data.
Microelectron. Reliab., 2003

2002
High-resolution SILC measurements of thin SiO<sub>2</sub> at ultra low voltages.
Microelectron. Reliab., 2002


  Loading...