Michael R. P. Ragazzon

According to our database, Michael R. P. Ragazzon authored at least 9 papers between 2015 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Analysis of PI-Control for Atomic Force Microscopy in Contact Mode.

Saverio Messineo, Michael R. P. Ragazzon, Fabio Busnelli, Jan Tommy Gravdahl

IEEE Trans. Control. Syst. Technol., 2022

2019

Model-Based Identification of Nanomechanical Properties in Atomic Force Microscopy: Theory and Experiments.

Michael R. P. Ragazzon, Jan Tommy Gravdahl, Kristin Ytterstad Pettersen

IEEE Trans. Control. Syst. Technol., 2019

2018

Lyapunov Estimator for High-Speed Demodulation in Dynamic Mode Atomic Force Microscopy.

Michael R. P. Ragazzon, Michael G. Ruppert, David M. Harcombe, Andrew J. Fleming, Jan Tommy Gravdahl

IEEE Trans. Control. Syst. Technol., 2018

2017

Exponential convergence bounds in least squares estimation: Identification of viscoelastic properties in atomic force microscopy.

Michael R. P. Ragazzon, Jan Tommy Gravdahl, Kristin Ytterstad Pettersen

Proceedings of the IEEE Conference on Control Technology and Applications, 2017

Frequency domain analysis of robust demodulators for high-speed atomic force microscopy.

Michael G. Ruppert, David M. Harcombe, Michael R. P. Ragazzon, S. O. Reza Moheimani, Andrew J. Fleming

Proceedings of the 2017 American Control Conference, 2017

Higher-harmonic AFM imaging with a high-bandwidth multifrequency Lyapunov filter.

David M. Harcombe, Michael G. Ruppert, Michael R. P. Ragazzon, Andrew J. Fleming

Proceedings of the IEEE International Conference on Advanced Intelligent Mechatronics, 2017

2016

On Amplitude Estimation for High-Speed Atomic Force Microscopy.

Michael R. P. Ragazzon, Jan Tommy Gravdahl, Andrew J. Fleming

Proceedings of the 2016 American Control Conference, 2016

Imaging topography and viscoelastic properties by constant depth atomic force microscopy.

Michael R. P. Ragazzon, Jan Tommy Gravdahl

Proceedings of the 2016 IEEE Conference on Control Applications, 2016

2015

Topography and force imaging in atomic force microscopy by state and parameter estimation.

Michael R. P. Ragazzon, Jan Tommy Gravdahl, Kristin Ytterstad Pettersen, Arnfinn Aas Eielsen

Proceedings of the American Control Conference, 2015