Michio Komoda

According to our database, Michio Komoda authored at least 4 papers between 1998 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule.

Masanori Kurimoto, Jun Matsushima, Shigeki Ohbayashi, Yoshiaki Fukui, Michio Komoda, Nobuhiro Tsuda

ACM Trans. Design Autom. Electr. Syst., 2012

2008

Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations.

Kan Takeuchi, Atsushi Yoshikawa, Michio Komoda, Ken Kotani, Hiroaki Matsushita, Yusaku Katsuki, YuyoYamamoto, Takao Sato

IEEE Trans. Very Large Scale Integr. Syst., 2008

2006

A Time-Slicing Ring Oscillator for Capturing Instantaneous Delay Degradation and Power Supply Voltage Drop.

Takashi Sato, Yu Matsumoto, Koji Hirakimoto, Michio Komoda, Junichi Mano

Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006

1998

Ground Bounce Considerations in DC Parametric Test Generation Using Boundary Scan.

Amitava Majumdar, Michio Komoda, Tim Ayres

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998