Mike Purtell

According to our database, Mike Purtell authored at least 3 papers between 1998 and 2001.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2001

Testing for resistive opens and stuck opens.

Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1998

Experimental Results for IDDQ and VLV Testing.

Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Analysis of pattern-dependent and timing-dependent failures in an experimental test chip.

Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998