Chao-Wen Tseng

According to our database, Chao-Wen Tseng authored at least 16 papers between 1998 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

A Design of GS1 EPCglobal Application Level Events Extension for IoT Applications.

Chao-Wen Tseng, Yu-Chang Chen, Chua-Huang Huang

IEICE Trans. Inf. Syst., 2016

2014

Adding IEEE 1451 Transducer Capability to EPCglobal Information Service.

Chao-Wen Tseng, Yi-Ting Liao, Chua-Huang Huang

Proceedings of the 2014 IEEE International Conference on Internet of Things, 2014

Extending EPCglobal ALE middleware to integrate transducer capability of IEEE 1451 standards.

Chao-Wen Tseng, Yu-Sheng Lin, Wei-Han Lu, Chua-Huang Huang

Proceedings of the Sixth International Conference on Ubiquitous and Future Networks, 2014

A uniform EPC scheme design of IEEE 1451 transducers for IoT applications.

Chao-Wen Tseng, Chua-Huang Huang

Proceedings of the Sixth International Conference on Ubiquitous and Future Networks, 2014

2012

Complex sensing event process of IoT application based on epcglobal architecture and IEEE 1451.

Chao-Wen Tseng, Chih-Ming Chang, Chua-Huang Huang

Proceedings of the 3rd IEEE International Conference on the Internet of Things, 2012

2008

Effective and Economic Phase Noise Testing for Single-Chip TV Tuners.

James Chien-Mo Li, Po-Chou Lin, Chih-Ming Chiang, Chuo-Jan Pan, Chao-Wen Tseng

IEEE Trans. Instrum. Meas., 2008

2004

ELF-Murphy Data on Defects and Test Sets.

Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

2002

Experimental Results for Slow-Speed Testing.

Chao-Wen Tseng, James Li, Edward J. McCluskey

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2001

An Evaluation of Pseudo Random Testing for Detecting Real Defects.

Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

MINVDD Testing for Weak CMOS ICs.

Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Multiple-output propagation transition fault test.

Chao-Wen Tseng, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

Testing for resistive opens and stuck opens.

Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Cold Delay Defect Screening.

Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Stuck-fault tests vs. actual defects.

Edward J. McCluskey, Chao-Wen Tseng

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1998

Experimental Results for IDDQ and VLV Testing.

Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Analysis of pattern-dependent and timing-dependent failures in an experimental test chip.

Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998