Mohamed H. Abu-Rahma

According to our database, Mohamed H. Abu-Rahma authored at least 10 papers between 2005 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2013

Experiments and analysis to characterize logic state retention limitations in 28nm process node.

Sachin Dileep Dasnurkar, Animesh Datta, Mohamed H. Abu-Rahma, Hieu Nguyen, Martin Villafana, Hadi Rasouli, Sean Tamjidi, Ming Cai, Samit Sengupta, P. R. Chidambaram, Raghavan Thirumala, Nikhil Kulkarni, Prasanna Seeram, Prasad Bhadri, Prayag Patel, Sei Seung Yoon, Esin Terzioglu

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology.

Animesh Datta, Mohamed H. Abu-Rahma, Sachin Dileep Dasnurkar, Hadi Rasouli, Sean Tamjidi, Ming Cai, Samit Sengupta, P. R. Chidambaram, Raghavan Thirumala, Nikhil Kulkarni, Prasanna Seeram, Prasad Bhadri, Prayag Patel, Sei Seung Yoon, Esin Terzioglu

Proceedings of the International Symposium on Quality Electronic Design, 2013

2011

Leakage power profiling and leakage power reduction using DFT hardware.

Rajamani Sethuram, Karim Arabi, Mohamed H. Abu-Rahma

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS.

Mohamed H. Abu-Rahma, Ying Chen, Wing Sy, Wee Ling Ong, Leon Yeow Ting, Sei Seung Yoon, Michael Han, Esin Terzioglu

Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011

2010

Reducing SRAM Power Using Fine-Grained Wordline Pulsewidth Control.

Mohamed H. Abu-Rahma, Mohab Anis, Sei Seung Yoon

IEEE Trans. Very Large Scale Integr. Syst., 2010

2008

A Statistical Design-Oriented Delay Variation Model Accounting for Within-Die Variations.

Mohamed H. Abu-Rahma, Mohab Anis

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008

A robust single supply voltage SRAM read assist technique using selective precharge.

Mohamed H. Abu-Rahma, Mohab Anis, Sei Seung Yoon

Proceedings of the ESSCIRC 2008, 2008

A methodology for statistical estimation of read access yield in SRAMs.

Mohamed H. Abu-Rahma, Kinshuk Chowdhury, Joseph Wang, Zhiqin Chen, Sei Seung Yoon, Mohab Anis

Proceedings of the 45th Design Automation Conference, 2008

2007

Variability in VLSI Circuits: Sources and Design Considerations.

Mohamed H. Abu-Rahma, Mohab Anis

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

2005

Leakage Current Variability in Nanometer Technologies, invited.

Mohab Anis, Mohamed H. Abu-Rahma

Proceedings of the 5th IEEE International Workshop on System-on-Chip for Real-Time Applications (IWSOC 2005), 2005