Mohammad Abdullah Al Shohel
Orcid: 0000-0001-6845-4306
According to our database1,
Mohammad Abdullah Al Shohel
authored at least 6 papers
between 2021 and 2025.
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Bibliography
2025
An Analytical Solution for Transient Electromigration Stress in Multisegment Straight-line Interconnects Based on a Stress-wave Model.
ACM Trans. Design Autom. Electr. Syst., July, 2025
2023
Recent Progress in the Analysis of Electromigration and Stress Migration in Large Multisegment Interconnects.
Proceedings of the 2023 International Symposium on Physical Design, 2023
Proceedings of the IEEE/ACM International Conference on Computer Aided Design, 2023
2021
A Linear-Time Algorithm for Steady-State Analysis of Electromigration in General Interconnects.
CoRR, 2021
Analytical Modeling of Transient Electromigration Stress based on Boundary Reflections.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021
A New, Computationally Efficient "Blech Criterion" for Immortality in General Interconnects.
Proceedings of the 58th ACM/IEEE Design Automation Conference, 2021