Mukund Sivaraman

According to our database, Mukund Sivaraman authored at least 12 papers between 1994 and 2002.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2002

PICO-NPA: High-Level Synthesis of Nonprogrammable Hardware Accelerators.

Robert Schreiber, Shail Aditya, Scott A. Mahlke, Vinod Kathail, B. Ramakrishna Rau, Darren C. Cronquist, Mukund Sivaraman

J. VLSI Signal Process., 2002

PICO: Automatically Designing Custom Computers.

Vinod Kathail, Shail Aditya, Robert Schreiber, B. Ramakrishna Rau, Darren C. Cronquist, Mukund Sivaraman

Computer, 2002

Cycle-time aware architecture synthesis of custom hardware accelerators.

Mukund Sivaraman, Shail Aditya

Proceedings of the International Conference on Compilers, 2002

2001

Path delay fault diagnosis and coverage-a metric and an estimationtechnique.

Mukund Sivaraman, Andrzej J. Strojwas

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2001

2000

Primitive path delay faults: identification and their use in timinganalysis.

Mukund Sivaraman, Andrzej J. Strojwas

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

1997

Primitive Path Delay Fault Identification.

Mukund Sivaraman, Andrzej J. Strojwas

Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

Timing analysis based on primitive path delay fault identification.

Mukund Sivaraman, Andrzej J. Strojwas

Proceedings of the 1997 IEEE/ACM International Conference on Computer-Aided Design, 1997

1996

A diagnosability metric for parametric path delay faults.

Mukund Sivaraman, Andrzej J. Strojwas

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

Diagnosis of parametric path delay faults.

Mukund Sivaraman, Andrzej J. Strojwas

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

Delay fault coverage: a realistic metric and an estimation technique for distributed path delay faults.

Mukund Sivaraman, Andrzej J. Strojwas

Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, 1996

1995

Test Vector Generation for Parametric Path Delay Faults.

Mukund Sivaraman, Andrzej J. Strojwas

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Towards Incorporating Device Parameter Variations in Timing Analysis.

Mukund Sivaraman, Andrzej J. Strojwas

Proceedings of the EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28, 1994