Noohul Basheer Zain Ali

According to our database, Noohul Basheer Zain Ali authored at least 19 papers between 2003 and 2017.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2017

Advances in Testing Techniques for Digital Microfluidic Biochips.

Vineeta Shukla, Fawnizu Azmadi Hussin, Nor Hisham Hamid, Noohul Basheer Zain Ali

Sensors, 2017

Offline Error Detection in MEDA-Based Digital Microfluidic Biochips Using Oscillation-Based Testing Methodology.

Vineeta Shukla, Fawnizu Azmadi Hussin, Nor Hisham Hamid, Noohul Basheer Zain Ali, Krishnendu Chakrabarty

J. Electron. Test., 2017

2016

A Review on Key Issues and Challenges in Devices Level MEMS Testing.

Muhammad Shoaib, Nor Hisham Hamid, Aamir Farooq Malik, Noohul Basheer Zain Ali, Mohammad Tariq Jan

J. Sensors, 2016

Fault Modeling and Simulation of MEDA Based Digital Microfluidics Biochips.

Vineeta Shukla, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Nor Hisham Hamid, Madiha A. Sheikh

Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016

2015

Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs.

Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski

IEEE Trans. Very Large Scale Integr. Syst., 2015

Implications of Burn-In Stress on NBTI Degradation.

Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski

CoRR, 2015

2014

Multivoltage Aware Resistive Open Fault Model.

Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski

IEEE Trans. Very Large Scale Integr. Syst., 2014

2013

Distributive and self-sustainable scheduling algorithm for wireless sensor networks.

Muhammad Aman Sheikh, Noohul Basheer Zain Ali, Azlan Awang

Proceedings of the 22nd Wireless and Optical Communication Conference, 2013

SEOS: Hardware Implementation of Real-Time Operating System for Adaptability.

Soon Ee Ong, Siaw Chen Lee, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin

Proceedings of the First International Symposium on Computing and Networking, 2013

Hardware implemented real-time operating system (abstract only).

Soon Ee Ong, Siaw Chen Lee, Noohul Basheer Zain Ali

Proceedings of the 2013 ACM/SIGDA International Symposium on Field Programmable Gate Arrays, 2013

2012

Design for cold test elimination - facing the Inverse Temperature Dependence (ITD) challenge.

Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin

Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

Multi-voltage aware resistive open fault modeling.

Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin

Proceedings of the 17th IEEE European Test Symposium, 2012

2011

IDVP (Intra-Die Variation Probe) for System-On-Chip (SoC) Infant Mortality screen.

Mohd Azman Abdul Latif, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2011), 2011

2010

Optimization of Processor Architecture for Image Edge Detection Filter.

Zahraa Elhassan M. Osman, Fawnizu Azmadi Hussin, Noohul Basheer Zain Ali

Proceedings of the 12th UKSim, 2010

Space Vector PWM for PMSM simulation using Matlab Simulink.

Anas Mohd Nazlee, Nor Hisham Hamid, Fawnizu Azmadi Hussin, Noohul Basheer Zain Ali

Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2010

2009

An investigation of delay fault testing for multi voltage design.

Noohul Basheer Zain Ali

PhD thesis, 2009

2007

Testing of Level Shifters in Multiple Voltage Designs.

Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi

Proceedings of the 14th IEEE International Conference on Electronics, 2007

2006

Dynamic Voltage Scaling Aware Delay Fault Testing.

Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi, Peter Harrod

Proceedings of the 11th European Test Symposium, 2006

2003

Design of low cost FPGA based PCI Bus Sniffer.

Chee Wei Liang, Noohul Basheer Zain Ali, Ramesh Seth Nair

Proceedings of the 2003 IEEE International Conference on Field-Programmable Technology, 2003