Nourredine Akkouche

According to our database, Nourredine Akkouche authored at least 2 papers between 2010 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Analog/RF test ordering in the early stages of production testing.

Nourredine Akkouche, Salvador Mir, Emmanuel Simeu, Mustapha Slamani

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

2010

Ordering of analog specification tests based on parametric defect level estimation.

Nourredine Akkouche, Salvador Mir, Emmanuel Simeu

Proceedings of the 28th IEEE VLSI Test Symposium, 2010