Emmanuel Simeu

ARIMA J., 2017

FPGA implementation of machine learning based image quality assessment.

[BibT_eX]

[DOI]

Proceedings of the 29th International Conference on Microelectronics, 2017

2016

One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits.

[BibT_eX]

[DOI]

Martin Andraud

IEEE Trans. Circuits Syst. I Regul. Pap., 2016

Evaluation of machine learning algorithms for image quality assessment.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

Fuzzy logic modeling for objective image quality assessment.

[BibT_eX]

[DOI]

Proceedings of the 2016 Conference on Design and Architectures for Signal and Image Processing (DASIP), 2016

2015

Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors.

[BibT_eX]

[DOI]

Athanasios Dimakos

Martin Andraud

Louay Abdallah

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

Adaptive healing procedure for lifetime improvement in Wireless Sensor Networks.

[BibT_eX]

[DOI]

Diane Tchuani Tchakonte

Maurice Tchuenté

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

Image quality assessment using nonlinear learning methods.

[BibT_eX]

[DOI]

Proceedings of the 27th International Conference on Microelectronics, 2015

High frequency jitter estimator for SoCs.

[BibT_eX]

[DOI]

Proceedings of the 20th IEEE European Test Symposium, 2015

2014

Detection of UWB signal using dirty template approach.

[BibT_eX]

[DOI]

Kosai Raoof

Signal Image Video Process., 2014

Design of tracking loop with dirty templates for UWB communication systems.

[BibT_eX]

[DOI]

Kosai Raoof

Paul-Henri Pugliesi-Conti

Signal Image Video Process., 2014

Solutions for the self-adaptation of communicating systems in operation.

[BibT_eX]

[DOI]

Michel Renovell

Fabien Soulier

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

One-Shot Calibration of RF Circuits Based on Non-Intrusive Sensors.

[BibT_eX]

[DOI]

Martin Andraud

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

Using statistical analysis and artificial intelligence tools for automatic assessment of video sequences.

[BibT_eX]

[DOI]

Brice Ekobo Akoa

Proceedings of the Color Imaging XIX: Displaying, 2014

2013

Cramer-Rao lower bounds and maximum likelihood timing synchronization for dirty template UWB communications.

[BibT_eX]

[DOI]

Signal Image Video Process., 2013

System-level modeling of electromechanical devices with energy consumption.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Systems Conference, 2013

Video decoder monitoring using non-linear regression.

[BibT_eX]

[DOI]

Brice Ekobo Akoa

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

Using Artificial Neural Network for Automatic Assessment of Video Sequences.

[BibT_eX]

[DOI]

Brice Ekobo Akoa

Proceedings of the 27th International Conference on Advanced Information Networking and Applications Workshops, 2013

Novel design of tracking process for UWB communication systems.

[BibT_eX]

[DOI]

Proceedings of the AFRICON 2013, Pointe aux Piments, Mauritius, September 9-12, 2013, 2013

2012

Analog/RF test ordering in the early stages of production testing.

[BibT_eX]

[DOI]

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

High-level modeling of power consumption in active linear analog circuits.

[BibT_eX]

[DOI]

Proceedings of the Great Lakes Symposium on VLSI 2012, 2012

2011

Inclusion of Power Consumption Information in High-Level Modeling of Linear Analog Blocks.

[BibT_eX]

[DOI]

J. Low Power Electron., 2011

SystemC AMS behavioral modeling of a CMOS video sensor.

[BibT_eX]

[DOI]

Serge Scotti

Proceedings of the IEEE/IFIP 19th International Conference on VLSI and System-on-Chip, 2011

SystemC-AMS high-level modeling of linear analog blocks with power consumption information.

[BibT_eX]

[DOI]

Proceedings of the 12th Latin American Test Workshop, 2011

Internal model control for a self-tuning Delay-Locked Loop in UWB communication systems.

[BibT_eX]

[DOI]

Kosai Raoof

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

Behavioral modeling of a CMOS video sensor platform using systemc AMS/TLM.

[BibT_eX]

[DOI]

Serge Scotti

Proceedings of the 2011 Forum on Specification & Design Languages, 2011

A SystemC AMS/TLM platform for CMOS video sensors.

[BibT_eX]

[DOI]

Serge Scotti

Proceedings of the 2011 Conference on Design and Architectures for Signal and Image Processing, 2011

2010

Ordering of analog specification tests based on parametric defect level estimation.

[BibT_eX]

[DOI]

Nourredine Akkouche

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Adaptive Logical Control of RF LNA Performances for Efficient Energy Consumption.

[BibT_eX]

[DOI]

Proceedings of the VLSI-SoC: Forward-Looking Trends in IC and Systems Design, 2010

Embedded test and control of analogue/RF circuits using intelligent resources.

[BibT_eX]

[DOI]

Proceedings of the 11th Latin American Test Workshop, 2010

Low Frequency Test for RF MEMS Switches.

[BibT_eX]

[DOI]

Gustavo Pamplona Rehder

Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

2009

Pseudorandom BIST for test and characterization of linear and nonlinear MEMS.

[BibT_eX]

[DOI]

Microelectron. J., 2009

Parameter identification of RF transceiver blocks using regressive models.

[BibT_eX]

[DOI]

Rafik Khereddine

Proceedings of the 9th IFAC Workshop on Programmable Devices and Embedded Systems, 2009

2008

Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing.

[BibT_eX]

[DOI]

VLSI Design, 2008

2007

Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing.

[BibT_eX]

[DOI]

J. Electron. Test., 2007

Envelope Detection Based Transition Time Supervision for Online Testing of RF MEMS Switches.

[BibT_eX]

[DOI]

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

CAT Platform for Analogue and Mixed-Signal Test Evaluation and Optimization.

[BibT_eX]

[DOI]

Proceedings of the VLSI-SoC: Research Trends in VLSI and Systems on Chip, 2006

2005

On-Chip Pseudorandom MEMS Testing.

[BibT_eX]

[DOI]

J. Electron. Test., 2005

2003

On-Line Testable Decimation Filter Design for AMS Systems.

[BibT_eX]

[DOI]

Mohammad A. Naal

Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

2002

Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach.

[BibT_eX]

[DOI]

Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002

2001

A Robust Fault Detection Scheme for Concurrent Testing of Linear Digital Systems.

[BibT_eX]

[DOI]

Ahmad Abdelhay

Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001

Robust Self Concurrent Test of Linear Digital Systems.

[BibT_eX]

[DOI]

Ahmad Abdelhay

Mohammad A. Naal

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000

Optimal Detector Design for On-line Testing of Linear Analog Systems.

[BibT_eX]

[DOI]

VLSI Design, 2000

High-Level Synthesis Methodology for On-Line Testability Optimization.

[BibT_eX]

[DOI]

Mohammad A. Naal

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

Analytical Redundancy Based Approach for Concurrent Fault Detection in Linear Digital Systems.

[BibT_eX]

[DOI]

Ahmad Abdelhay

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

1999

Automatic Design of Optimal Concurrent Fault Detector for Linear Analog Systems.

[BibT_eX]

[DOI]