Oleg Semenov

According to our database1, Oleg Semenov authored at least 17 papers between 2002 and 2014.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2014
The Effects of Multivalency and Kinetics in Nanoscale Search by Molecular Spiders.
Proceedings of the Evolution, Complexity and Artificial Life, 2014

2013
Cooperative linear cargo transport with molecular spiders.
Nat. Comput., 2013

Catalytic Molecular Walkers: Aspects of Product Release.
Proceedings of the Twelfth European Conference on the Synthesis and Simulation of Living Systems: Advances in Artificial Life, 2013

2011
A Review of PVT Compensation Circuits for Advanced CMOS Technologies.
Circuits Syst., 2011

Новые возможности поиска и графического представления информации базы данных по основным параметрам гигантского дипольного резонанса ядер (New Abilities in Search and Graphical Presentation for Information on the Main Parameters of Giant Dipole Resonance of Atomic Nuclei Data Base).
Proceedings of the 13th All-Russian Scientific Conference "Digital libraries: Advanced Methods and Technologies, 2011

Multiple Molecular Spiders with a Single Localized Source - The One-Dimensional Case - (Extended Abstract).
Proceedings of the DNA Computing and Molecular Programming - 17th International Conference, 2011

2007
Temperature dependence of I<sub>DDQ</sub> distribution: application for thermal delta I<sub>DDQ</sub> testing.
IET Circuits Devices Syst., 2007

Optimizing Circuit Performance and ESD Protection for High-Speed Differential I/Os.
Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2006
Novel gate and substrate triggering techniques for deep sub-micron ESD protection devices.
Microelectron. J., 2006

Throughput of WLAN Systems with LDPC Codes and Adaptive Bit Loading.
Proceedings of the IEEE 17th International Symposium on Personal, 2006

2005
Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment.
Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005

2004
The Impact of CMOS technology scaling on MOSFETs second breakdown: Evaluation of ESD robustness.
Microelectron. Reliab., 2004

Evaluation of STI degradation using temperature dependence of leakage current in parasitic STI MOSFET.
Microelectron. Reliab., 2004

2003
Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta <i>I</i><sub>DDQ</sub> Testing.
J. Electron. Test., 2003

Burn-in Temperature Projections for Deep Sub-micron Technologies.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Thermal Management of High Performance Microprocessors.
Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

2002
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI.
Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002


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