Ali Keshavarzi

According to our database, Ali Keshavarzi authored at least 42 papers between 1997 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Towards site-specific management of soil organic carbon: Comparing support vector machine and ordinary kriging approaches based on pedo-geomorphometric factors.

Sunshine A. De Caires, Ali Keshavarzi, Eduardo Leonel Bottega, Fuat Kaya

Comput. Electron. Agric., January, 2024

2021

Dealing with soil organic carbon modeling: some insights from an agro-ecosystem in Northeast Iran.

Ali Keshavarzi, Henry Oppong Tuffour, Jimmy Clifford Oppong, Mojtaba Zeraatpisheh, Vinod Kumar

Earth Sci. Informatics, 2021

2020

FerroElectronics for Edge Intelligence.

Ali Keshavarzi, Kai Ni, Wilbert van den Hoek, Suman Datta, Arijit Raychowdhury

IEEE Micro, 2020

2019

Edge Intelligence - On the Challenging Road to a Trillion Smart Connected IoT Devices.

Ali Keshavarzi, Wilbert van den Hoek

IEEE Des. Test, 2019

Determining the best ISUM (Improved stock unearthing Method) sampling point number to model long-term soil transport and micro-topographical changes in vineyards.

Jesús Rodrigo-Comino, Ali Keshavarzi, Mojtaba Zeraatpisheh, Yeboah Gyasi-Agyei, Artemi Cerdà

Comput. Electron. Agric., 2019

2017

Using soil easily measured parameters for estimating soil water capacity: Soft computing approaches.

Jalal Shiri, Ali Keshavarzi, Özgür Kisi, Sepideh Karimi

Comput. Electron. Agric., 2017

Modeling soil cation exchange capacity using soil parameters: Assessing the heuristic models.

Jalal Shiri, Ali Keshavarzi, Özgür Kisi, Ursula Iturrarán-Viveros, Ali Bagherzadeh, Seyed Rohollah Mousavi, Sepideh Karimi

Comput. Electron. Agric., 2017

2014

Directions in future of SRAM with QDR-WideIO for high performance networking applications and beyond.

Ali Keshavarzi, Dinesh Maheshwari, Derwin Mattos, Ravi Kapre, Sandeep Krishnegowda, Morgan Whately, Sudhir Gopalswamy

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014

2013

EP3: Empowering the killer SoC applications of 2020.

Shekhar Borkar, Uming Ko, Ali Keshavarzi, Eugenio Cantatore

Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013

2011

Developing Pedotransfer Functions for Estimating Field Capacity and Permanent Wilting Point Using Fuzzy Table Look-up Scheme.

Ali Keshavarzi, Fereydoon Sarmadian, Reza Labbafi, Abbas Ahmadi

Comput. Inf. Sci., 2011

2009

2 GHz 2 Mb 2T Gain Cell Memory Macro With 128 GBytes/sec Bandwidth in a 65 nm Logic Process Technology.

Dinesh Somasekhar, Yibin Ye, Paolo A. Aseron, Shih-Lien Lu, Muhammad M. Khellah, Jason Howard, Gregory Ruhl, Tanay Karnik, Shekhar Borkar, Vivek K. De, Ali Keshavarzi

IEEE J. Solid State Circuits, 2009

2008

2GHz 2Mb 2T Gain-Cell Memory Macro with 128GB/s Bandwidth in a 65nm Logic Process.

Dinesh Somasekhar, Yibin Ye, Paolo A. Aseron, Shih-Lien Lu, Muhammad M. Khellah, Jason Howard, Gregory Ruhl, Tanay Karnik, Shekhar Y. Borkar, Vivek De, Ali Keshavarzi

Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008

2006

Impact of Thermal Gradients on Clock Skew and Testing.

Sebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura

IEEE Des. Test Comput., 2006

2005

Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF.

Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay

Proceedings of the 18th International Conference on VLSI Design (VLSI Design 2005), 2005

Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage.

Ali Keshavarzi, Gerhard Schrom, Stephen Tang, Sean Ma, Keith A. Bowman, Sunit Tyagi, Kevin Zhang, Tom Linton, Nagib Hakim, Steven G. Duvall, John Brews, Vivek De

Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005

Adaptive circuit techniques to minimize variation impacts on microprocessor performance and power.

James W. Tschanz, Siva G. Narendra, Ali Keshavarzi, Vivek De

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs.

José Luis Rosselló, Vicent Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura

Proceedings of the 2005 Design, 2005

2004

DFT for Delay Fault Testing of High-Performance Digital Circuits.

Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi

IEEE Des. Test Comput., 2004

A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs.

Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism.

Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura, Ali Keshavarzi

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Design optimizations for microprocessors at low temperature.

Arman Vassighi, Ali Keshavarzi, Siva G. Narendra, Gerhard Schrom, Yibin Ye, Seri Lee, Greg Chrysler, Manoj Sachdev, Vivek De

Proceedings of the 41th Design Automation Conference, 2004

2003

Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ.

Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De

IEEE Trans. Very Large Scale Integr. Syst., 2003

Forward body bias for microprocessors in 130-nm technology generation and beyond.

Siva G. Narendra, Ali Keshavarzi, Bradley A. Bloechel, Shekhar Borkar, Vivek De

IEEE J. Solid State Circuits, 2003

Burn-in Temperature Projections for Deep Sub-micron Technologies.

Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing.

Bartomeu Alorda, Brad Bloechel, Ali Keshavarzi, Jaume Segura

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Thermal Management of High Performance Microprocessors.

Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect.

Charles F. Hawkins, Ali Keshavarzi, Jaume Segura

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

Parameter variations and impact on circuits and microarchitecture.

Shekhar Borkar, Tanay Karnik, Siva G. Narendra, James W. Tschanz, Ali Keshavarzi, Vivek De

Proceedings of the 40th Design Automation Conference, 2003

CMOS IC nanometer technology failure mechanisms.

Charles F. Hawkins, Ali Keshavarzi, Jaume Segura

Proceedings of the IEEE Custom Integrated Circuits Conference, 2003

2002

Analysis of dual-V_T SRAM cells with full-swing single-ended bit line sensing for on-chip cache.

Fatih Hamzaoglu, Yibin Ye, Ali Keshavarzi, Kevin Zhang, Siva G. Narendra, Shekhar Borkar, Mircea R. Stan, Vivek De

IEEE Trans. Very Large Scale Integr. Syst., 2002

Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits.

Ali Keshavarzi, James W. Tschanz, Siva G. Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins

IEEE Des. Test Comput., 2002

IDDQ Testing for Deep-Submicron ICs: Challenges and Solutions.

Zhanping Chen, Liqiong Wei, Ali Keshavarzi, Kaushik Roy

IEEE Des. Test Comput., 2002

Challenges in Nanometric Technology Scaling: Trends and Projections.

Jaume Segura, Vivek De, Ali Keshavarzi

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Parametric Failures in CMOS ICs - A Defect-Based Analysis.

Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits.

Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI.

Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi

Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002

2001

Design and Test of Low Voltage CMOS Circuits.

Kaushik Roy, Ali Keshavarzi

Proceedings of the 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 2001

Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs.

Ali Keshavarzi, Sean Ma, Siva G. Narendra, Brad Bloechel, K. Mistry, Tahir Ghani, Shekhar Borkar, Vivek De

Proceedings of the 2001 International Symposium on Low Power Electronics and Design, 2001

2000

Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions.

Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins

IEEE Trans. Very Large Scale Integr. Syst., 2000

Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ.

Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's.

Ali Keshavarzi, Siva G. Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De

Proceedings of the 1999 International Symposium on Low Power Electronics and Design, 1999

1997

Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs.

Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997