Michael Glavanovics
According to our database1,
Michael Glavanovics
authored at least 12 papers
between 2004 and 2023.
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Bibliography
2023
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2015
Executable test definition for a state machine driven embedded test controller module.
Proceedings of the 13th IEEE International Conference on Industrial Informatics, 2015
2013
Proceedings of the 11th IEEE International Conference on Industrial Informatics, 2013
2012
Modeling of highly anisotropic microstructures for electro-thermal simulations of power semiconductor devices.
Microelectron. Reliab., 2012
2011
Microelectron. Reliab., 2011
Improved thermal management of low voltage power devices with optimized bond wire positions.
Microelectron. Reliab., 2011
Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability.
Microelectron. Reliab., 2011
2010
Non-linear thermal modeling of DMOS transistor and validation using electrical measurements and FEM simulations.
Microelectron. J., 2010
2009
IR thermography and FEM simulation analysis of on-chip temperature during thermal-cycling power-metal reliability testing using in situ heated structures.
Microelectron. Reliab., 2009
System level modeling of smart power switches using SystemC-AMS for digital protection concept verification.
Proceedings of the 2009 IEEE International Behavioral Modeling and Simulation Workshop, 2009
2007
Microelectron. Reliab., 2007
2004
Analysis of wire bond and metallization degradation mechanisms in DMOS power transistors stressed under thermal overload conditions.
Microelectron. Reliab., 2004