Olivia P. Dizon-Paradis

Orcid: 0000-0002-6879-8624

According to our database1, Olivia P. Dizon-Paradis authored at least 13 papers between 2019 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2024
DOSCrack: Deobfuscation Using Oracle-Guided Symbolic Execution and Clustering of Binary Security Keys.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2024

2023
A Fast Object Detection-Based Framework for Via Modeling on PCB X-Ray CT Images.
ACM J. Emerg. Technol. Comput. Syst., October, 2023

A Comprehensive Taxonomy of Visual Printed Circuit Board Defects.
J. Hardw. Syst. Secur., September, 2023

FPIC: A Novel Semantic Dataset for Optical PCB Assurance.
ACM J. Emerg. Technol. Comput. Syst., April, 2023

A Survey and Perspective on Artificial Intelligence for Security-Aware Electronic Design Automation.
ACM Trans. Design Autom. Electr. Syst., March, 2023

SECURE: A Segmentation Quality Evaluation Metric on SEM Images for Reverse Engineering on Integrated Circuits.
IEEE Access, 2023

2022
FICS PCB X-ray: A dataset for automated printed circuit board inter-layers inspection.
IACR Cryptol. ePrint Arch., 2022

Semi-Supervised Semantic Annotator (S3A): Toward Efficient Semantic Labeling.
Proceedings of the 21st Python in Science Conference 2022, 2022

2021
Why Is Deep Learning Challenging for Printed Circuit Board (PCB) Component Recognition and How Can We Address It?
Cryptogr., 2021

A Comparison of Neural Networks for PCB Component Segmentation.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2021

2020
The Big Hack Explained: Detection and Prevention of PCB Supply Chain Implants.
ACM J. Emerg. Technol. Comput. Syst., 2020

FICS-PCB: A Multi-Modal Image Dataset for Automated Printed Circuit Board Visual Inspection.
IACR Cryptol. ePrint Arch., 2020

2019
Is Backside the New Backdoor in Modern SoCs?: Invited Paper.
Proceedings of the IEEE International Test Conference, 2019


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