Omar Al-Terkawi Hasib

According to our database, Omar Al-Terkawi Hasib authored at least 8 papers between 2010 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage.

Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault

IEEE Trans. Very Large Scale Integr. Syst., 2020

2019

Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality Metrics.

Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault

J. Electron. Test., 2019

2018

Exploiting built-in delay lines for applying launch-on-capture at-speed testing on self-timed circuits.

Omar Al-Terkawi Hasib, Daniel Crepeau, Thomas Awad, Andrei Dulipovici, Yvon Savaria, Claude Thibeault

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

2016

WeSPer: A flexible small delay defect quality metric.

Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015

Self-timed circuits FPGA implementation flow.

Mickaël Fiorentino, Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault

Proceedings of the IEEE 13th International New Circuits and Systems Conference, 2015

2012

Propagating analog signals through a fully digital network on an electronic system prototyping platform.

Omar Al-Terkawi Hasib, Walder Andre, Yves Blaquière, Yvon Savaria

Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

2011

A Low-Power Asynchronous Step-Down DC-DC Converter for Implantable Devices.

Omar Al-Terkawi Hasib, Mohamad Sawan, Yvon Savaria

IEEE Trans. Biomed. Circuits Syst., 2011

2010

Fully integrated ultra-low-power asynchronously driven step-down DC-DC converter.

Omar Al-Terkawi Hasib, Mohamad Sawan, Yvon Savaria

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010