Patrick Pons

Orcid: 0000-0002-7989-3272

According to our database1, Patrick Pons authored at least 35 papers between 1999 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
Capacitive Effect and Electromagnetic Coupling on Manganin Gauge Limiting the Bandwidth for Pressure Measurements under Shock Conditions.
Sensors, July, 2023

Toward Improvements in Pressure Measurements for Near Free-Field Blast Experiments.
Sensors, 2023

2022
Transient Response of Miniature Piezoresistive Pressure Sensor Dedicated to Blast Wave Monitoring.
Sensors, 2022

Frequency Bandwidth of Pressure Sensors Dedicated to Blast Experiments.
Sensors, 2022

2021
Microelectromechanical Transducer to Monitor High-Doses of Nuclear Irradiation.
Sensors, 2021

2019
In-Situ Wireless Pressure Measurement Using Zero-Power Packaged Microwave Sensors.
Sensors, 2019

Radar Imaging Approach for Zero-Power Millimeter-Wave Wireless Sensors.
Proceedings of the IEEE International Conference on RFID Technology and Applications, 2019

2018
Modeling of Microfluidically Tuned Capacitor for RF Applications.
Proceedings of the 15th International Multi-Conference on Systems, Signals & Devices, 2018

Design and Simulation of a 10 GHz VCO Using an RF MEMS Solenoid Inductor.
Proceedings of the 15th International Multi-Conference on Systems, Signals & Devices, 2018

2016
Wireless pressure measurement in air blast using PVDF sensors.
Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016

Wireless hydrogen pressure dosimeter for nuclear high dose monitoring.
Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016

2013
Wireless sensing and identification based on radar cross section variability measurement of passive electromagnetic sensors.
Ann. des Télécommunications, 2013

2012
Wireless sensing and identification of passive electromagnetic sensors based on millimetre-wave FMCW RADAR.
Proceedings of the 2012 IEEE International Conference on RFID-Technologies and Applications, 2012

2011
Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818].
Microelectron. Reliab., 2011

On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies.
Microelectron. Reliab., 2011

2010
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques.
Microelectron. Reliab., 2010

Methods to improve reliability of bulge test technique to extract mechanical properties of thin films.
Microelectron. Reliab., 2010

Miniaturized wireless sensor network
CoRR, 2010

2009
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions.
Microelectron. Reliab., 2009

2008
Alpha particle radiation effects in RF MEMS capacitive switches.
Microelectron. Reliab., 2008

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.
Microelectron. Reliab., 2008

Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches.
Microelectron. Reliab., 2008

2007
Structure dependent charging process in RF MEMS capacitive switches.
Microelectron. Reliab., 2007

2006
Charging-Effects in RF capacitive switches influence of insulating layers composition.
Microelectron. Reliab., 2006

Charging of radiation induced defects in RF MEMS dielectric films.
Microelectron. Reliab., 2006

2005
Biaxial initial stress characterization of bilayer gold RF-switches.
Microelectron. Reliab., 2005

Investigation of charging mechanisms in metal-insulator-metal structures.
Microelectron. Reliab., 2005

Thermal and electrostatic reliability characterization in RF MEMS switches.
Microelectron. Reliab., 2005

2004
Smart MEMS concept for high secure RF and millimeterwave communications.
Microelectron. Reliab., 2004

2003
Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling.
Microelectron. Reliab., 2003

Effect of the membrane flatness defect on the offset voltage of a silicon piezoresistive pressure sensor.
Proceedings of the 2003 10th IEEE International Conference on Electronics, 2003

2000
Effect of the silicon membrane flatness defect on the piezoresistive pressure sensor response.
Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000

1999
Performances and potentialities of a very simple self-compensated pressure sensor demonstrator.
IEEE Trans. Instrum. Meas., 1999

Optimization of a BiCMOS integrated transducer for self-compensated capacitive pressure sensor.
Proceedings of the 6th IEEE International Conference on Electronics, Circuits and Systems, 1999

Study of the thermal drift of the offset voltage of silicon pressure sensor.
Proceedings of the 6th IEEE International Conference on Electronics, Circuits and Systems, 1999


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