Fabio Coccetti

According to our database, Fabio Coccetti authored at least 20 papers between 2005 and 2017.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2017

200 mm Wafer level graphene transfer by wafer bonding technique.

Mesut Inac, Grzegorz Lupina, Matthias Wietstruck, Marco Lisker, Mirko Fraschke, Andreas Mai, Fabio Coccetti, Mehmet Kaynak

Proceedings of the 47th European Solid-State Device Research Conference, 2017

2015

Large electromagnetic simulation by hybrid approach on large-scale parallel computing systems.

Mihai Alexandru, Thierry Monteil, Petr Lorenz, Fabio Coccetti, Hervé Aubert

Concurr. Comput. Pract. Exp., 2015

2013

Failure analysis and detection methodology for capacitive RF-MEMS switches based on BEOL BiCMOS process.

Nuria Torres Matabosch, Fabio Coccetti, Mehmet Kaynak, Beatrice Espana, Bernd Tillack, Jean-Louis Cazaux

Microelectron. Reliab., 2013

2012

An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices.

Jinyu Jason Ruan, Nicolas Monnereau, David Trémouilles, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, Robert Plana

IEEE Trans. Instrum. Meas., 2012

Estimation of RF performance from LF measurements: Towards the design for reliability in RF-MEMS.

Nuria Torres Matabosch, Mehmet Kaynak, Fabio Coccetti, Matthias Wietstruck, Bernd Tillack, Jean Louis Cazaux

Microelectron. Reliab., 2012

Large electromagnetic problem on large scale parallel computing systems.

Mihai Alexandru, Thierry Monteil, Fabio Coccetti, Hervé Aubert, Petr Lorenz

Proceedings of the 2012 International Conference on High Performance Computing & Simulation, 2012

2011

Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818].

Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana

Microelectron. Reliab., 2011

On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies.

Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana

Microelectron. Reliab., 2011

2010

Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques.

Usama Zaghloul, Matroni Koutsoureli, H. Wang, Fabio Coccetti, George J. Papaioannou, Patrick Pons, Robert Plana

Microelectron. Reliab., 2010

Life expectancy and characterization of capacitive RF MEMS switches.

Mohamed Matmat, K. Koukos, Fabio Coccetti, T. Idda, Antoine Marty, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève

Microelectron. Reliab., 2010

2009

Three-Dimensional RF MEMS Switch for Power Applications.

Joo-Young Choi, Jinyu Jason Ruan, Fabio Coccetti, Stepan Lucyszyn

IEEE Trans. Ind. Electron., 2009

Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions.

Usama Zaghloul, George J. Papaioannou, Fabio Coccetti, Patrick Pons, Robert Plana

Microelectron. Reliab., 2009

Accelerated lifetime test of RF-MEMS switches under ESD stress.

Jinyu Jason Ruan, Nicolas Nolhier, George J. Papaioannou, David Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, Robert Plana

Microelectron. Reliab., 2009

Capacitive RF MEMS analytical predictive reliability and lifetime characterization.

Mohamed Matmat, Fabio Coccetti, Antoine Marty, Robert Plana, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève

Microelectron. Reliab., 2009

Deployment and management of large planar reflectarray antennas simulation on grid.

Rémi Sharrock, Fadi Khalil, Thierry Monteil, Hervé Aubert, Fabio Coccetti, Patricia Stolf, Laurent Broto, Robert Plana

Proceedings of the 7th international workshop on Challenges of large applications in distributed environments, 2009

2008

ESD failure signature in capacitive RF MEMS switches.

Jinyu Jason Ruan, George J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, Marise Bafleur, Fabio Coccetti, Robert Plana

Microelectron. Reliab., 2008

Alpha particle radiation effects in RF MEMS capacitive switches.

Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons, George J. Papaioannou, Robert Plana

Microelectron. Reliab., 2008

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.

Mohamed Lamhamdi, Patrick Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, Jean Guastavino, Y. Segui, George J. Papaioannou, Robert Plana

Microelectron. Reliab., 2008

2007

Electrostatic discharge failure analysis of capacitive RF MEMS switches.

Jinyu Jason Ruan, Nicolas Nolhier, Marise Bafleur, Laurent Bary, Fabio Coccetti, T. Lisec, Robert Plana

Microelectron. Reliab., 2007

2005

Investigation of charging mechanisms in metal-insulator-metal structures.

M. A. Exarchos, V. Theonas, Patrick Pons, George J. Papaioannou, S. Mellé, David Dubuc, Fabio Coccetti, Robert Plana

Microelectron. Reliab., 2005