Patrick Scharf

According to our database, Patrick Scharf authored at least 2 papers between 2019 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance.

Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim

Proceedings of the IEEE European Test Symposium, 2025

2019

Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations.

Patrick Scharf, Christoph Sohrmann, Steffen Holland, Volkhard Beyer

Proceedings of the 49th European Solid-State Device Research Conference, 2019