Luc Romain

According to our database, Luc Romain authored at least 7 papers between 2018 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Early Testing of Memory Redundant Row Elements.

Luc Romain, Roger Mah, Katarzyna Wojnowska, Albert Au, Lori Schramm

Proceedings of the IEEE International Test Conference, 2025

Holistic Memory DFT Partitioning Using a Convolution-Based Algorithm.

Olivier Romain, Wojciech Gierszal, Luc Romain, Artur Pogiel

Proceedings of the IEEE European Test Symposium, 2025

Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance.

Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim

Proceedings of the IEEE European Test Symposium, 2025

2024

Combining Built-In Redundancy Analysis with ECC for Memory Testing.

Luc Romain, Paul-Patrick Nordmann, Benoit Nadeau-Dostie, Lori Schramm, Martin Keim

Proceedings of the IEEE European Test Symposium, 2024

2023

Transitioning eMRAM from Pilot Project to Volume Production.

Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim

Proceedings of the IEEE International Test Conference, 2023

2020

Memory repair logic sharing techniques and their impact on yield.

Benoit Nadeau-Dostie, Luc Romain

Proceedings of the IEEE International Test Conference, 2020

2018

Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions.

Venkat Yellapragada, Suresh Raman, Banadappa Shivaray, Luc Romain, Benoit Nadeau-Dostie, Martin Keim, Jean-Francois Cote, Albert Au, Giri Podichetty, Ashok Anbalan

Proceedings of the IEEE International Test Conference in Asia, 2018