Jongsin Yun

According to our database, Jongsin Yun authored at least 6 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Transitioning eMRAM from Pilot Project to Volume Production.

Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim

Proceedings of the IEEE International Test Conference, 2023

Smart Hammering: A practical method of pinhole detection in MRAM memories.

Sina Bakhtavari Mamaghani, Christopher Münch, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2022

MBIST-based Trim-Search Test Time Reduction for STT-MRAM.

Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

2021

MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM.

Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

MBIST Supported Multi Step Trim for Reliable eMRAM Sensing.

Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda

Proceedings of the IEEE International Test Conference, 2020

MBIST Support for Reliable eMRAM Sensing.

Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Cyrille Dray, El Mehdi Boujamaa

Proceedings of the IEEE European Test Symposium, 2020