Lori Schramm

According to our database, Lori Schramm authored at least 11 papers between 2020 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Early Testing of Memory Redundant Row Elements.

Luc Romain, Roger Mah, Katarzyna Wojnowska, Albert Au, Lori Schramm

Proceedings of the IEEE International Test Conference, 2025

Holistic Validation Pattern Generation for IEEE 1687 and Streaming Scan Networks.

Sebastian Huhn, Matthias Kampmann, Jan Burchard, Reinhard Meier, Kacper Czerniawski, Lori Schramm, Sandipan Sharma, Nikita Naresh, Wilson Pradeep, Prachi Sinha, Mayank Parasrampuria, Jonathan Gaudet, Martin Keim

Proceedings of the IEEE International Test Conference, 2025

Persistent High-Bandwidth IJTAG Data Delivery.

Jan Burchard, Matthias Kampmann, Ayush Patel, Marta Stepniewska, Przemyslaw Szymanski, Wojciech Janiszewski, Jean-François Côté, Michal Olejarz, Olga Przybysz, Lori Schramm, Jonathan Gaudet, Martin Keim

Proceedings of the IEEE International Test Conference, 2025

Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance.

Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim

Proceedings of the IEEE European Test Symposium, 2025

A Novel BIST Method for Multi-Port Register Files.

Andy Chen, Vianney Choserot, Munish Kumar, Khushal Gelda, Shreyas Pramod Dixit, Wei Zou, Jongsin Yun, Harshitha Kodali, Albert Au, Lori Schramm, Martin Keim

Proceedings of the IEEE European Test Symposium, 2025

2024

Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies.

Jaehoon Lee, Hyeonuk Son, Seohyun Kang, Dahyun Kang, Dongkwan Han, Jongsin Yun, Artur Pogiel, Etienne Racine, Krzysztof Jurga, Lori Schramm, Martin Keim

Proceedings of the IEEE International Test Conference, 2024

High-Bandwidth IJTAG over SSN.

Jonathan Gaudet, Jan Burchard, Matthias Kampmann, Jean-François Côté, Tim Callahan, Hung Ho Chai, Ivy Ee Hsia Lim, Lori Schramm, Olga Przybysz, Marta Stepniewska, Sascha Ochsenknecht, Michal Olejarz, Martin Keim

Proceedings of the IEEE International Test Conference, 2024

Combining Built-In Redundancy Analysis with ECC for Memory Testing.

Luc Romain, Paul-Patrick Nordmann, Benoit Nadeau-Dostie, Lori Schramm, Martin Keim

Proceedings of the IEEE European Test Symposium, 2024

2023

Transitioning eMRAM from Pilot Project to Volume Production.

Cyrille Dray, Khushal Gelda, Benoit Nadeau-Dostie, Wei Zou, Luc Romain, Jongsin Yun, Harshitha Kodali, Lori Schramm, Martin Keim

Proceedings of the IEEE International Test Conference, 2023

2020

MBIST Supported Multi Step Trim for Reliable eMRAM Sensing.

Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim, Lori Schramm, Cyrille Dray, El Mehdi Boujamaa, Khushal Gelda

Proceedings of the IEEE International Test Conference, 2020

IJTAG Through a Two-Pin Chip Interface.

Manu Baby, Bernd Büttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, Jean-François Côté, Givargis Danialy, Martin Keim, Lori Schramm

Proceedings of the IEEE International Test Conference, 2020