Pedro Fernández

Orcid: 0000-0001-8329-9391

According to our database1, Pedro Fernández authored at least 11 papers between 2006 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

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Bibliography

2023
Time-Sensitive Networking to meet Hard-real Time Boundaries on Edge Intelligence Applications.
Proceedings of the 38th Conference on Design of Circuits and Integrated Systems, 2023

2022
Accelerating Video Analytic Processing on Edge Intelligence.
Proceedings of the 37th Conference on Design of Circuits and Integrated Systems, 2022

2020
Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners.
Sensors, 2020

2014
Influence of Surface Position along the Working Range of Conoscopic Holography Sensors on Dimensional Verification of AISI 316 Wire EDM Machined Surfaces.
Sensors, 2014

2012
Review of the CALIMAS Team Contributions to European Space Agency's Soil Moisture and Ocean Salinity Mission Calibration and Validation.
Remote. Sens., 2012

2010
An Analysis of the Significance of MDD for Industry.
Proceedings of the 2010 International Conference on Software Engineering Research & Practice, 2010

2009
Influence of Surface Material on the Quality of Laser Triangulation Digitized Point Clouds for Reverse Engineering Tasks.
Proceedings of 12th IEEE International Conference on Emerging Technologies and Factory Automation, 2009

2008
Selection of Ambient Light for Laser Digitizing of Quasi-Lambertian Surfaces.
Proceedings of the Advances in Electrical Engineering and Computational Science, 2008

Ray-Tracing Techniques Applied to the Accessibility Analysis for the Automatic Contact and Non Contact Inspection.
Proceedings of the Advances in Electrical Engineering and Computational Science, 2008

2006
Constraints Evaluation and Working Methodology for Laser Scanning of Free-Form Surfaces.
Proceedings of 11th IEEE International Conference on Emerging Technologies and Factory Automation, 2006

Accessibility Analysis for Automatic Inspection Using Bounding Volume Hierarchies.
Proceedings of 11th IEEE International Conference on Emerging Technologies and Factory Automation, 2006


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