B. Foucher

According to our database, B. Foucher authored at least 5 papers between 2001 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics.

F. Molière, B. Foucher, Philippe Perdu, Alain Bravaix

Microelectron. Reliab., 2009

2007

Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics.

E. Scanff, K. L. Feldman, S. Ghelam, Peter Sandborn, M. Glade, B. Foucher

Microelectron. Reliab., 2007

2002

Experimental and 3D simulation correlation of a gg-nMOS transistor under high current pulse.

Philippe Galy, V. Berland, B. Foucher, A. Guilhaume, J. P. Chante, S. Bardy, F. Blanc

Microelectron. Reliab., 2002

A review of reliability prediction methods for electronic devices.

B. Foucher, J. Boullié, B. Meslet, D. Das

Microelectron. Reliab., 2002

2001

Simulation and experimental comparison of GGNMOS and LVTSCR protection cells under ElectroStatic Discharges.

A. Guilhaume, Philippe Galy, J. P. Chante, B. Foucher, F. Blanc

Microelectron. Reliab., 2001