Piero Franco

According to our database, Piero Franco authored at least 9 papers between 1991 and 1996.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1996

Analysis and Detection of Timing Failures in an Experimental Test Chip.

Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

An Experimental Chip to Evaluate Test Techniques: Experiment Results.

Siyad C. Ma, Piero Franco, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design.

Piero Franco, William D. Farwell, Robert L. Stokes, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Three-pattern tests for delay faults.

Piero Franco, Edward J. McCluskey

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

On-line delay testing of digital circuits.

Piero Franco, Edward J. McCluskey

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

1992

Simple Bounds on Serial Signature Analysis Aliasing for Random Testing.

Nirmal R. Saxena, Piero Franco, Edward J. McCluskey

IEEE Trans. Computers, 1992

1991

Refined Bounds on Signature Analysis Aliasing for Random Testing.

Nirmal R. Saxena, Piero Franco, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

Delay Testing of Digital Circuits by Output Waveform Analysis.

Piero Franco, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

Bounds on Signature Analysis Aliasing for Random Testing.

Nirmal R. Saxena, Piero Franco, Edward J. McCluskey

Proceedings of the 1991 International Symposium on Fault-Tolerant Computing, 1991