Siyad C. Ma

According to our database, Siyad C. Ma authored at least 7 papers between 1992 and 1999.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1999

A comparison of bridging fault simulation methods.

R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Testability Features of the AMD-K6 Microprocessor.

R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma

IEEE Des. Test Comput., 1998

1997

Testability Features of AMD-K6^TM Microprocessor.

R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

Analysis and Detection of Timing Failures in an Experimental Test Chip.

Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

Open faults in BiCMOS gates.

Siyad C. Ma, Edward J. McCluskey

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

An Experimental Chip to Evaluate Test Techniques: Experiment Results.

Siyad C. Ma, Piero Franco, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1992

Non-Conventional Faults in BiCMOS Digital Circuits.

Siyad C. Ma, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992