Prasad Chaparala

According to our database, Prasad Chaparala authored at least 5 papers between 2002 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2005

Impact of NBTI and HCI on PMOSFET threshold voltage drift.

Prasad Chaparala, Douglas Brisbin

Microelectron. Reliab., 2005

Optimizing the hot carrier reliability of N-LDMOS transistor arrays.

Douglas Brisbin, Andy Strachan, Prasad Chaparala

Microelectron. Reliab., 2005

2004

Influence of mobility model on extraction of stress dependent source-drain series resistance.

Merlyne M. De Souza, S. K. Manhas, D. Chandra Sekhar, A. S. Oates, Prasad Chaparala

Microelectron. Reliab., 2004

Evaluation of performance-reliability trade-offs in a Si-Ge BiCMOS process using fast wafer level techniques.

Barry O'Connell, Prasad Chaparala, Bhola Mehrotra

Microelectron. Reliab., 2004

2002

Influence of test techniques on soft breakdown detection in ultra-thin oxides.

Douglas Brisbin, Prasad Chaparala

Microelectron. Reliab., 2002