R. Dufayel

According to our database, R. Dufayel authored at least 1 paper in 2003.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2003

Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.

Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière

Microelectron. Reliab., 2003