Pascal Fouillat

According to our database, Pascal Fouillat authored at least 31 papers between 1997 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

A CMOS Resizing Methodology for Analog Circuits.

Timothée Levi, Jean Tomas, Noëlle Lewis, Pascal Fouillat

IEEE Des. Test Comput., 2009

2008

Effect of physical defect on shmoos in CMOS DSM technologies.

Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely

Microelectron. Reliab., 2008

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection.

Vincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

2006

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.

Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat

Microelectron. Reliab., 2006

2005

Impact of semiconductors material on IR Laser Stimulation signal.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2005

Electrical Modeling for Laser Testing with Different Pulse Durations.

Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2004

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC.

Vincent Pouget, Dean Lewis, Pascal Fouillat

IEEE Trans. Instrum. Meas., 2004

Understanding the effects of NIR laser stimulation on NMOS transistor.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2004

Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections.

Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis

Microelectron. Reliab., 2004

2003

Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.

Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière

Microelectron. Reliab., 2003

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS).

Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat

Microelectron. Reliab., 2003

A physical approach on SCOBIC investigation in VLSI.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto

Microelectron. Reliab., 2003

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles

Microelectron. Reliab., 2003

2002

A VLSI CMOS delay oriented waveform converter for polyphase frequency synthesizer.

Anne Spataro, Yann Deval, Jean-Baptiste Bégueret, Pascal Fouillat

IEEE J. Solid State Circuits, 2002

A 4 Gsamples/S with 2-4 GHz Input Bandwidth SIGE Digitizer for Radio Astronomy Applications.

David Deschans, Jean-Baptiste Bégueret, Yann Deval, Christophe Scarabello, Pascal Fouillat, Guy Montignac, Alain Baudry

Proceedings of the 15th Annual Symposium on Integrated Circuits and Systems Design, 2002

Dynamic Fault Injection in Integrated Circuits with a Pulsed Laser.

Dean Lewis, Pascal Fouillat, Vincent Pouget

Proceedings of the 3rd Latin American Test Workshop, 2002

Laser Utilization for Various Testing Purposes.

Pascal Fouillat

Proceedings of the 3rd Latin American Test Workshop, 2002

A SiGe 4-Gsps 2-bits digitizer with 2-4 GHz input bandwidth.

David Deschans, Jean-Baptiste Bégueret, Yann Deval, Christophe Scarabello, Pascal Fouillat, Guy Montignac, Alain Baudry

Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002

2001

Theoretical Investigation of an Equivalent Laser LET.

Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner

Microelectron. Reliab., 2001

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.

Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu

Microelectron. Reliab., 2001

A New Laser System for X-Rays Flashes Sensitivity Evaluation.

Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat

Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001

Phase error determination in GMSK modulated fractional-N PLL.

L. Camino, Serge Ramet, Jean-Baptiste Bégueret, Yann Deval, Pascal Fouillat

Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001

A CMOS VLSI delay oriented waveform converter dedicated to the synthesizer of an UMTS transceiver.

Anne Spataro, Yann Deval, Jean-Baptiste Bigueret, Pascal Fouillat, Didier Belot

Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, 2001

Clock generator using factorial DLL for video applications.

Jean-Baptiste Bégueret, Yann Deval, Olivier Mazouffre, Anne Spataro, Pascal Fouillat, Eric Benoit, Jean Mendoza

Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, 2001

2000

Toward Analog Circuit Synthesis: A Global Methodology Based upon Design of Experiments.

Yann Deval, Jean-Baptiste Bégueret, Jean Tomas, Pascal Fouillat

Proceedings of the 13th Annual Symposium on Integrated Circuits and Systems Design, 2000

An Overview of the Applications of a Pulsed Laser System for SEU Testing.

Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

Delay oriented design methodology: application to the design of a VHF low power VLSI polyphase oscillator.

Anne Spataro, Yann Deval, Jean-Baptiste Bégueret, Pascal Fouillat

Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000

1999

Using artificial neural networks or Lagrange interpolation to characterize the faults in an analog circuit: an experimental study.

Yvan Maiden, Barrie W. Jervis, Pascal Fouillat, S. Lesage

IEEE Trans. Instrum. Meas., 1999

Hierarchical Analogue Design and Behavioural Modelling.

Thomas Zimmer, N. Milet-Lewis, Ahmed Fakhfakh, B. Ardouin, Hervé Levi, J. B. Duluc, Pascal Fouillat

Proceedings of the IEEE International Conference on Microelectronic Systems Education, 1999

A New Industrial Approach Compatible With Microelectronics Education: Application to an RF System Design.

Jean Tomas, Yann Deval, Jean-Baptiste Bégueret, Pascal Fouillat, J. L. Aucouturier

Proceedings of the IEEE International Conference on Microelectronic Systems Education, 1999

1997

Design, integration and characterization of analog integrated circuits: a complete design flow dedicated to microelectronics education.

Jean Tomas, Yann Deval, Pascal Fouillat, E. Ragbi, Jean Paul Dom, J. L. Aucouturier

Proceedings of the 1997 IEEE International Conference on Microelectronic Systems Education, 1997