R. Lavieville

According to our database, R. Lavieville authored at least 2 papers between 2016 and 2023.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2023

Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited).

William Vandendaele, Camille Leurquin, R. Lavieville, Marie-Anne Jaud, Abygaël Viey, Romain Gwoziecki, B. Mohamad, E. Nowak, A. Constant, Ferdinando Iucolano

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2016

Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs.

R. Lavieville, Theano A. Karatsori, Christoforos G. Theodorou, Sylvain Barraud, C. A. Dimitriadis, Gérard Ghibaudo

Proceedings of the 46th European Solid-State Device Research Conference, 2016