R. T. Venkatesh

According to our database, R. T. Venkatesh authored at least 1 paper in 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2011

An efficient test data reduction technique through dynamic pattern mixing across multiple fault models.

Srinivasulu Alampally, R. T. Venkatesh, Priyadharshini Shanmugasundaram, Rubin A. Parekhji, Vishwani D. Agrawal

Proceedings of the 29th IEEE VLSI Test Symposium, 2011