René Kothe

According to our database, René Kothe authored at least 11 papers between 2005 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Test Data and Power Reductions for Transition Delay Tests for Massive-Parallel Scan Structures.

René Kothe, Heinrich Theodor Vierhaus

Proceedings of the 13th Euromicro Conference on Digital System Design, 2010

2008

A Scan Controller Concept for Low Power Scan Tests.

René Kothe, Heinrich Theodor Vierhaus

J. Low Power Electron., 2008

Embedded Diagnostic Logic Test Exploiting Regularity.

Heinrich Theodor Vierhaus, René Kothe

Proceedings of the 11th Euromicro Conference on Digital System Design: Architectures, 2008

2007

A Configurable Modular Test Processor and Scan Controller Architecture.

R. Frost, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

Flip-Flops and Scan-Path Elements for Nanoelectronics.

René Kothe, Heinrich Theodor Vierhaus

Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

2006

Built-in Self Repair by Reconfiguration of FPGAs.

S. Habermann, René Kothe, Heinrich Theodor Vierhaus

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

Embedded Scan Test with Diagnostic Features for Self-Testing SoCs.

Christian Galke, René Kothe, Sabine Schultke, K. Winkler, Jeanette Honko, Heinrich Theodor Vierhaus

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

Embedded Self Repair by Transistor and Gate Level Reconfiguration.

René Kothe, Heinrich Theodor Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube

Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

Hardware/Software Based Hierarchical Self Test for SoCs.

René Kothe, Christian Galke, Sabine Schultke, Henry Fröschke, Steffen Gaede, Heinrich Theodor Vierhaus

Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

Logic Self Repair.

Christian Galke, René Kothe, Heinrich Theodor Vierhaus

Proceedings of the ARCS 2006, 2006

2005

A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features.

René Kothe, Christian Galke, Heinrich Theodor Vierhaus

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005