Christian Galke

According to our database, Christian Galke authored at least 13 papers between 2000 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

A Configurable Modular Test Processor and Scan Controller Architecture.

R. Frost, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

Embedded Scan Test with Diagnostic Features for Self-Testing SoCs.

Christian Galke, René Kothe, Sabine Schultke, K. Winkler, Jeanette Honko, Heinrich Theodor Vierhaus

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes.

Christian Galke, U. Gätzschmann, Heinrich Theodor Vierhaus

Proceedings of the Ninth Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD 2006), 30 August, 2006

Hardware/Software Based Hierarchical Self Test for SoCs.

René Kothe, Christian Galke, Sabine Schultke, Henry Fröschke, Steffen Gaede, Heinrich Theodor Vierhaus

Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

Logic Self Repair.

Christian Galke, René Kothe, Heinrich Theodor Vierhaus

Proceedings of the ARCS 2006, 2006

2005

A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features.

René Kothe, Christian Galke, Heinrich Theodor Vierhaus

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2004

A Hierarchical Self Test Scheme for SoCs.

Claudia Kretzschmar, Christian Galke, Heinrich Theodor Vierhaus

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

2003

On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check.

Matthias Pflanz, Karsten Walther, Christian Galke, Heinrich Theodor Vierhaus

J. Electron. Test., 2003

Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip.

Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus

Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

2002

On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check.

Matthias Pflanz, Karsten Walther, Christian Galke, Heinrich Theodor Vierhaus

Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002

On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures.

Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus

Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002

A Test Processor Concept for Systems-on-a-Chip.

Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus

Proceedings of the 20th International Conference on Computer Design (ICCD 2002), 2002

2000

A new method for on-line state machine observation for embedded microprocessors.

Matthias Pflanz, Christian Galke, Heinrich Theodor Vierhaus

Proceedings of the IEEE International High-Level Design Validation and Test Workshop 2000, 2000