Rohan Thomas

According to our database, Rohan Thomas authored at least 8 papers between 2015 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of two.

2020

Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2019

Image degradation from hot pixel defects with pixel size shrinkage.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren

Proceedings of the Image Sensors and Imaging Systems 2019, 2019

Detecting SEUs in Noisy Digital Imagers with small pixels.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren

Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019

2018

Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Parham Purbakht, Israel Koren, Zahava Koren

Proceedings of the Image Sensors and Imaging Systems 2018, 2018

Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren

Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018

2016

Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes.

Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren

Proceedings of the Image Sensors and Imaging Systems 2016, 2016

Experimental study and analysis of soft and permanent errors in digital cameras.

Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Israel Koren, Zahava Koren

Proceedings of the 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2016

2015

Single Event Upsets and Hot Pixels in digital imagers.

Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015