Sam M.-H. Hsiao

According to our database1, Sam M.-H. Hsiao authored at least 2 papers between 2022 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2023
Preventing Single-Event Double-Node Upsets by Engineering Change Order in Latch Designs.
Proceedings of the IEEE International Test Conference, 2023

2022
Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65nm CMOS Technologies.
Proceedings of the IEEE International Test Conference, 2022


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