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Seiichiro Higashi

According to our database1, Seiichiro Higashi authored at least 9 papers between 2005 and 2013.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2013
Evaluation of Chemical Composition and Bonding Features of Pt/SiO<sub>x</sub>/Pt MIM Diodes and Its Impact on Resistance Switching Behavior.
[BibTeX]
[DOI]
Akio Ohta
,
Katsunori Makihara
,
Mitsuhisa Ikeda
,
Hideki Murakami
,
Seiichiro Higashi
,
Seiichi Miyazaki
IEICE Trans. Electron., 2013

Control of Interfacial Reaction of HfO<sub>2</sub>/Ge Structure by Insertion of Ta Oxide Layer.
[BibTeX]
[DOI]
Kuniaki Hashimoto
,
Akio Ohta
,
Hideki Murakami
,
Seiichiro Higashi
,
Seiichi Miyazaki
IEICE Trans. Electron., 2013

2012
Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering.
[BibTeX]
[DOI]
Akio Ohta
,
Yuta Goto
,
Shingo Nishigaki
,
Guobin Wei
,
Hideki Murakami
,
Seiichiro Higashi
,
Seiichi Miyazaki
IEICE Trans. Electron., 2012

2011
Impact of Annealing Ambience on Resistive Switching in Pt/TiO<sub>2</sub>/Pt Structure.
[BibTeX]
[DOI]
Guobin Wei
,
Yuta Goto
,
Akio Ohta
,
Katsunori Makihara
,
Hideki Murakami
,
Seiichiro Higashi
,
Seiichi Miyazaki
IEICE Trans. Electron., 2011

Characterization of Mg Diffusion into HfO<sub>2</sub>/SiO<sub>2</sub>/Si(100) Stacked Structures and Its Impact on Detect State Densities.
[BibTeX]
[DOI]
Akio Ohta
,
Daisuke Kanme
,
Hideki Murakami
,
Seiichiro Higashi
,
Seiichi Miyazaki
IEICE Trans. Electron., 2011

2008
Progress on Charge Distribution in Multiply-Stacked Si Quantum Dots/SiO<sub>2</sub> Structure as Evaluated by AFM/KFM.
[BibTeX]
[DOI]
Katsunori Makihara
,
Mitsuhisa Ikeda
,
Seiichiro Higashi
,
Seiichi Miyazaki
IEICE Trans. Electron., 2008

2007
Evaluation of Dielectric Reliability of Ultrathin HfSiO<sub>x</sub>N<sub>y</sub> in Metal-Gate Capacitors.
[BibTeX]
[DOI]
Yanli Pei
,
Hideki Murakami
,
Seiichiro Higashi
,
Seiichi Miyazaki
,
Seiji Inumiya
,
Yasuo Nara
IEICE Trans. Electron., 2007

2005
Characterization of Atom Diffusion in Polycrystalline Si/SiGe/Si Stacked Gate.
[BibTeX]
[DOI]
Hideki Murakami
,
Yoshikazu Moriwaki
,
Masafumi Fujitake
,
Daisuke Azuma
,
Seiichiro Higashi
,
Seiichi Miyazaki
IEICE Trans. Electron., 2005

Characterization of Germanium Nanocrystallites Grown on SiO<sub>2</sub> by a Conductive AFM Probe Technique.
[BibTeX]
[DOI]
Katsunori Makihara
,
Yoshihiro Okamoto
,
Hideki Murakami
,
Seiichiro Higashi
,
Seiichi Miyazaki
IEICE Trans. Electron., 2005


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